Lachance and Bussell Family Genealogy

CHARTRAND, Marie-Suzanne

Female 1681 - 1750  (69 years)


Personal Information    |    Sources    |    All

  • Name CHARTRAND, Marie-Suzanne 
    Birth 26 Jun 1681  Montréal, (Île de Montréal), Québec, Canada Find all individuals with events at this location  [1
    Christening (Notre-Dame-de-Montréal), Montréal, (Île de Montréal), Québec, Canada Find all individuals with events at this location 
    Gender Female 
    _UID 5E9903BAB0464C06928B49C03A6532100341 
    Death 6 Sep 1750  Rivière-des-Prairies, (Ile-de-Montréal), Québec, Canada Find all individuals with events at this location  [1
    Person ID I178270  Lachance and Bussell Family Tree
    Last Modified 13 May 2020 

    Father CHARTRAND, Thomas,   b. Abt 1643, Rouen, Seine Maritime, France Find all individuals with events at this locationd. 1 Nov 1708, Rivière-des-Prairies, (Ile-de-Montréal), Québec, Canada Find all individuals with events at this location (Age ~ 65 years) 
    Mother MATHON DIT LABRIE, Marie-Jeanne,   b. 5 Jan 1664, Québec, (Québec-ville), Québec, Canada Find all individuals with events at this locationd. Abt 24 Aug 1740, Rivière-des-Prairies, (Ile-de-Montréal), Québec, Canada Find all individuals with events at this location (Age 76 years) 
    Marriage 17 Apr 1679  (Notre-Dame-de-Montréal), Montréal, (Île de Montréal), Québec, Canada Find all individuals with events at this location  [2
    Family ID F22331  Group Sheet  |  Family Chart

    Family CHRISTIN DIT ST AMOUR, Isaac   d. Yes, date unknown 
    Marriage 2 Mar 1699  (La Purification-de-la-Bienheureuse-Vierge-Marie), Repentigny, (L'Assomption), Québec, Canada Find all individuals with events at this location  [1
    Family ID F74467  Group Sheet  |  Family Chart
    Last Modified 13 May 2020 

  • Sources 
    1. [S14] University of Montréal, PRDH Programme de recherche en démographie historique, Family # 4828 (Reliability: 4).

    2. [S14] University of Montréal, PRDH Programme de recherche en démographie historique, Couple # 1555 (Reliability: 4).