Lachance and Bussell Family Genealogy

PÉPIN, Marie-Marguerite

Female 1720 - 1797  (76 years)


Personal Information    |    Sources    |    All

  • Name PÉPIN, Marie-Marguerite 
    Birth 10 Mar 1720  Charlesbourg, (Québec), Québec, Canada Find all individuals with events at this location  [1
    Christening (St-Charles-Borromée), Charlesbourg, (Québec), Québec, Canada Find all individuals with events at this location 
    Gender Female 
    _UID 663F1F45754D420395CB24BAA4B0FAB955BA 
    Death 1 Feb 1797  Québec, (Québec-ville), Québec, Canada Find all individuals with events at this location  [1
    Burial (Notre-Dame-de-Québec), Québec, (Québec-ville), Canada Find all individuals with events at this location 
    Person ID I196944  Lachance and Bussell Family Tree
    Last Modified 19 Sep 2023 

    Father PÉPIN, Jean,   b. 10 Sep 1675, Québec, (Québec-ville), Québec, Canada Find all individuals with events at this locationd. 30 Dec 1752, Charlesbourg, (Québec), Québec, Canada Find all individuals with events at this location (Age 77 years) 
    Mother MOREAU, Marie-Marguerite,   b. 3 Nov 1676, Québec, (Québec-ville), Québec, Canada Find all individuals with events at this locationd. 13 Jan 1752, Charlesbourg, (Québec), Québec, Canada Find all individuals with events at this location (Age 75 years) 
    Marriage 10 Oct 1695  (Notre-Dame-de-Québec), Québec, (Québec-ville), Canada Find all individuals with events at this location  [2
    Family ID F12822  Group Sheet  |  Family Chart

    Family HIANVEU DIT LAFRANCE, Mathieu   d. Yes, date unknown 
    Marriage 28 Aug 1752  (St-Charles-Borromée), Charlesbourg, (Québec), Québec, Canada Find all individuals with events at this location  [1
    Family ID F82158  Group Sheet  |  Family Chart
    Last Modified 19 Sep 2023 

  • Sources 
    1. [S14] University of Montréal, PRDH Programme de recherche en démographie historique, Family # 7503 (Reliability: 3).

    2. [S14] University of Montréal, PRDH Programme de recherche en démographie historique, Family # 7503 (Reliability: 4).