Lachance and Bussell Family Genealogy

LACHANCE, Albert Jean-Baptiste Joseph

Male 1918 - 1992  (74 years)


Personal Information    |    Sources    |    All

  • Name LACHANCE, Albert Jean-Baptiste Joseph 
    Birth 29 Aug 1918  West Warwick, (Kent), RI Find all individuals with events at this location 
    Gender Male 
    FindaGrave Memorial ID 70944918 
    _UID 80175BD53DB14B158D7EBE437898C8ACA5C7 
    Death 21 Oct 1992  West Warwick, (Kent), RI Find all individuals with events at this location 
    Burial 24 Oct 1992  (St. Joseph Cemetery), West Warwick, (Kent), RI Find all individuals with events at this location 
    Person ID I53966  Lachance and Bussell Family Tree
    Last Modified 18 May 2022 

    Father LACHANCE, Joseph Simeon Cleophas,   b. 4 May 1873, Saint-Évariste-de-Forsyth, (Frontenac), Québec, Canada Find all individuals with events at this locationd. 21 Mar 1949, Arctic, (Kent), RI Find all individuals with events at this location (Age 75 years) 
    Mother DALLAIRE, Anna,   b. 16 Jan 1875, St-Honoré-de-Shenley, (Beauce), Québec, Canada Find all individuals with events at this locationd. 1946 (Age 70 years) 
    Marriage 14 Oct 1895  (St. John Baptiste), Centreville, (Kent), RI Find all individuals with events at this location  [1
    Family ID F6427  Group Sheet  |  Family Chart

    Family JARBEAU, Beatrice,   b. 23 Feb 1913, Rhode Island Find all individuals with events at this locationd. Nov 1993, West Warwick, (Kent), RI Find all individuals with events at this location (Age 80 years) 
    Marriage 28 May 1955  (St. Joseph), Natick, (Kent), RI Find all individuals with events at this location  [2
    Children 
     1. Living
    Family ID F25832  Group Sheet  |  Family Chart
    Last Modified 24 Feb 2012 

  • Sources 
    1. [S2] Certificate of Marriage, Duplicate copy of original certificate dated July 30, 1944 from St. Jean Baptiste Church. (Reliability: 4).

    2. [S102] AFGS 1993, Marriages of St. Joseph's Catholic Church - Natick, Rhode Island, (1875-1989), (AFGS 1993), Page 99 (Reliability: 3).