Lachance and Bussell Family Genealogy

HAMEL, Joseph

Male 1723 - Abt 1781  (58 years)


Personal Information    |    Sources    |    All

  • Name HAMEL, Joseph 
    Birth 19 Mar 1723  Ste-Foy, (Québecville), Québec, Canada Find all individuals with events at this location  [1
    Christening 2 Apr 1723  (Notre-Dame-de-Foy), Ste-Foy, (Québecville), Québec, Canada Find all individuals with events at this location  [1
    Gender Male 
    _UID FF8558148E2B45E7B14388D7C18B05FF784F 
    Death Abt 3 Apr 1781  Québec, (Québec-ville), Québec, Canada Find all individuals with events at this location 
    Burial 3 Apr 1781  (Notre-Dame-de-Québec), Québec, (Québec-ville), Canada Find all individuals with events at this location  [1
    Person ID I69643  Lachance and Bussell Family Tree
    Last Modified 12 Sep 2023 

    Father HAMEL, André,   b. Abt 1690, Lieu Indéterminé, (au Québec), Canada Find all individuals with events at this locationd. Abt 10 Dec 1649, Ste-Foy, (Québecville), Québec, Canada Find all individuals with events at this location 
    Mother MOREAU, Félicité   d. Yes, date unknown 
    Marriage 20 Apr 1717  (Notre-Dame-de-Foy), Ste-Foy, (Québecville), Québec, Canada Find all individuals with events at this location  [2, 3
    Family ID F82094  Group Sheet  |  Family Chart

    Family BOITEAU, Marie   d. Yes, date unknown 
    Marriage 19 Nov 1757  (Notre-Dame-de-Québec), Québec, (Québec-ville), Canada Find all individuals with events at this location  [1
    Children 
    +1. HAMEL, Marie-Louise   d. Yes, date unknown
    Family ID F29269  Group Sheet  |  Family Chart
    Last Modified 12 Sep 2023 

  • Sources 
    1. [S14] University of Montréal, PRDH Programme de recherche en démographie historique, PRDH Individual Certificate for Joseph Hamel # 155199 (Reliability: 3).

    2. [S14] University of Montréal, PRDH Programme de recherche en démographie historique, Family # 12531 (Reliability: 3).

    3. [S14] University of Montréal, PRDH Programme de recherche en démographie historique, Family # 6041 (Reliability: 3).